Research

EOS/ESD Symposium

latent_2003_ESD_interconnect_structures
latent_2004_ESD_latent_defects_CMOS_ICs
latent_2009_multiple_ESD_discharges
latent_2012_CDM_ESD_failure

Other Journals

latent_1993_parametric_drift_and_latent_ESD
latent_1994_damage_on_CMOS_input_gates
latent_2001_thin_oxide_impulse_stress
latent_2002_single_event_latchup
latent_2007_current_impulse_oxide_breakdown